Masterclass: High resolution particle size analysis using Differential Centrifugal Sedimentation (DCS)

We are pleased to invite you to join our latest free-to-attend partner webinar hosted by Steve Fitzpatrick, founder and developer of DCS and President of CPS Instruments Inc.

Differential Centrifugal Sedimentation (DCS) is a powerful tool in measuring nanoparticle size distribution down to around 2nm. With the unique ability to resolve very close multi-modal particle distributions, and to distinguish extremely small shifts and changes in particle size, DCS is once more gaining in popularity as a novel and innovative technique

The practical range of the technique is from around 2nm right up to 80 microns (exact range will be dependent on density), however the real benefits over and above more traditional nanoparticle sizing techniques (such as Dynamic Light Scattering (DLS)) are generally noticed below around 300nm.