Schmidt+Haensch’s automatic microprocessor controlled critical angle refractometers are designed to measure refractive index of liquid media independent of opacity, viscosity and colour.
Established in 1864, Schmidt+Haensch have pioneered the technology behind polarimetry and refractometry. They now hold several key patents, enabling them to produce opto-electronic measuring instruments of the highest quality and accuracy.
We will be happy to work together with you on a solution with the full support of the Schmidt+Haensch team, based in Berlin, Germany. Visit our contact page, request a quote, or call us on +44 (0)1954 232 776.